Initialising ...
Initialising ...
Initialising ...
Initialising ...
Initialising ...
Initialising ...
Initialising ...
Sueyoshi, Tetsuro*; Kotaki, Tetsuya*; Furuki, Yuichi*; Fujiyoshi, Takanori*; Semboshi, Satoshi*; Ozaki, Toshinori*; Sakane, Hitoshi*; Kudo, Masaki*; Yasuda, Kazuhiro*; Ishikawa, Norito
Japanese Journal of Applied Physics, 59(2), p.023001_1 - 023001_7, 2020/02
Times Cited Count：6 Percentile：38.95(Physics, Applied)We show that Xe ion irradiation with 80 MeV to GdBa
Cu
Oy-coated conductors creates different morphologies of columnar defects (CDs) depending on the irradiation angles relative to the c-axis: continuous CDs with a larger diameter are formed for oblique irradiation at 
= 45
, whereas the same ion beam at a different angle ( = 0) induces the formation of discontinuous CDs. The direction-dependent morphologies of CDs significantly affect the angular behavior of the critical current density 
.
Kuriyama, Yasutoshi*; Iwashita, Yoshihisa*; Hirota, Katsuya*; Hayano, Hitoshi*; Fuwa, Yasuhiro
Proceedings of 16th Annual Meeting of Particle Accelerator Society of Japan (Internet), p.32 - 35, 2019/10
Research and development of gradient enhancement of superconducting RF accelerating cavity is carried out by accelerator research institute in the world, but defects on the cavity surface limit accelerating electric field. Therefore, development of "Inside inspection system for superconducting accelerated cavity" that optically visualizes the state of the inner surface of the superconducting cavity has been carried out, and results have been achieved. In this research, we apply image processing technology that has developed remarkably in recent years to the internal inspection system, and advanced the defect recognition method. Extraction of depth information and image synthesis were performed from images obtained with different focal positions with the camera for internal surface inspection. Also, by performing pattern recognition processing on the images, automatic detection of defects has become possible. By integrating these techniques into the cavity inner surface inspection system, it becomes possible to shorten the scan time for defect search and acquire the defect shape.
110
and 100 oriented REBCO tapesOsamura, Kozo*; Machiya, Shutaro*; Kajiwara, Kentaro*; Kawasaki, Takuro; Harjo, S.; Zhang, Y.*; Fujita, Shinji*; Iijima, Yasuhiro*; Hampshire, D. P.*
AIP Advances (Internet), 9(7), p.075216_1 - 075216_11, 2019/07
Times Cited Count：7 Percentile：37.59(Nanoscience & Nanotechnology)Hashimoto, Tadashi*; Tanida, Kiyoshi; 49 of others*
IEEE Transactions on Applied Superconductivity, 27(4), p.2100905_1 - 2100905_5, 2017/06
Times Cited Count：12 Percentile：54.67(Engineering, Electrical & Electronic)Matsuda, Makoto; Takeuchi, Suehiro; Tsukihashi, Yoshihiro; Horie, Katsuzo; Ouchi, Isao; Hanashima, Susumu; Abe, Shinichi; Ishizaki, Nobuhiro; Tayama, Hidekazu; Nakanoya, Takamitsu; et al.
Dai-17-Kai Tandemu Kasokuki Oyobi Sono Shuhen Gijutsu No Kenkyukai Hokokushu, p.1 - 4, 2004/00
no abstracts in English
Nishio, Satoshi
Denki Gakkai Purazuma Kenkyukai Shiryo (PST-03-37), p.1 - 6, 2003/10
no abstracts in English
Nishio, Satoshi; Tobita, Kenji; Ushigusa, Kenkichi; Konishi, Satoshi
Purazuma, Kaku Yugo Gakkai-Shi, 78(11), p.1218 - 1230, 2002/11
no abstracts in English
Seki, Masahiro; Hishinuma, Akimichi; Kurihara, Kenichi; Akiba, Masato; Abe, Tetsuya; Ishitsuka, Etsuo; Imai, Tsuyoshi; Enoeda, Mikio; Ohira, Shigeru; Okumura, Yoshikazu; et al.
Kaku Yugoro Kogaku Gairon; Mirai Enerugi Eno Chosen, 246 Pages, 2001/09
no abstracts in English
Koizumi, Norikiyo; Ando, Toshinari; Takahashi, Yoshikazu; Tsuji, Hiroshi; Shimamoto, Susumu*
IEEE Transactions on Applied Superconductivity, 11(1), p.2575 - 2578, 2001/03
Times Cited Count：2 Percentile：23.34(Engineering, Electrical & Electronic)no abstracts in English
Raman, R.*; Itami, Kiyoshi
Purazuma, Kaku Yugo Gakkai-Shi, 76(10), p.1079 - 1087, 2000/10
no abstracts in English
Shizuma, Toshiyuki; Hajima, Ryoichi; Minehara, Eisuke
Proceedings of 25th Linear Accelerator Meeting in Japan, p.53 - 55, 2000/07
no abstracts in English
Sakaki, Hironao; Nagai, Ryoji; Yoshikawa, Hiroshi; Minehara, Eisuke
Proceedings of 25th Linear Accelerator Meeting in Japan, p.261 - 263, 2000/07
no abstracts in English
Oda, Yoshihiro; Funasaka, Hideyuki; Wang, X.*; Obara, Kenji*; Wada, Hitoshi*
JNC TY8400 2000-002, 47 Pages, 2000/03
JNC-TY8400-2000-002.pdf:2.53MB
no abstracts in English
Ando, Toshinari; Hiyama, Tadao; Takahashi, Yoshikazu; Nakajima, Hideo; Kato, Takashi; Isono, Takaaki; Sugimoto, Makoto; Kawano, Katsumi; Koizumi, Norikiyo; Nunoya, Yoshihiko; et al.
Denki Gakkai Rombunshi, B, 120(3), p.449 - 456, 2000/03
no abstracts in English
Shizuma, Toshiyuki; Minehara, Eisuke; Nishimori, Nobuyuki; Nagai, Ryoji; Hajima, Ryoichi; Sawamura, Masaru; Kikuzawa, Nobuhiro; Yamauchi, Toshihiko
Proceedings of 20th International Linac Conference (CD-ROM), 3 Pages, 2000/00
no abstracts in English
AlHomma, Tetsuo; Haga, Yoshinori; Yamamoto, Etsuji; Metoki, Naoto; Koike, Yoshihiro; Osakabe, Toyotaka; Onuki, Yoshichika
Journal of the Physical Society of Japan, 68(12), p.4047 - 4048, 1999/12
Times Cited Count：1 Percentile：16.25(Physics, Multidisciplinary)no abstracts in English
Udagawa, Akira; *; *; *; Seguchi, Tadao
JAERI-Tech 99-022, 31 Pages, 1999/03
no abstracts in English
Matsuzaki, Yoshimi
Denki Gakkai Gijutsu Hokoku, (709), p.54 - 58, 1999/01
no abstracts in English
Sn superconducting wire and large current conductorIsono, Takaaki; Nunoya, Yoshihiko; Matsui, Kunihiro; Sugimoto, Makoto; Yoshida, Kiyoshi; Nishi, Masataka; Takahashi, Yoshikazu; Ando, Toshinari; Tsuji, Hiroshi; Shimamoto, Susumu*
Denki Gakkai Rombunshi, B, 119(11), p.1263 - 1269, 1999/00
no abstracts in English
